Magnetic properties dependence of mesoscopic scale thick films on thickness and surface roughness characteristics: case of nickel samples in Ni/Pt system

Jean Ebothé

doi:10.1016/j.jmmm.2019.165764

Journal Articles Journal of Magnetism and Magnetic Materials Year : 2020

Magnetic properties dependence of mesoscopic scale thick films on thickness and surface roughness characteristics: case of nickel samples in Ni/Pt system

(1)

1

Jean Ebothé

Function : Correspondent author

Laboratoire de Recherche en Nanosciences - EA 4682

Keywords

Mesoscopic scale thick films Surface topography Thin film’s magnetic properties Magnetic microstructures

Domains

Electromagnetism Materials Micro and nanotechnologies/Microelectronics

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S0304885319324163.pdf (499.73 Ko)

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https://hal.science/hal-02939511

Submitted on : Wednesday, July 20, 2022-3:07:43 PM

Last modification on : Thursday, May 18, 2023-3:56:21 AM

Long-term archiving on: Friday, October 21, 2022-8:39:43 PM

Dates and versions

hal-02939511 , version 1 (20-07-2022)

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Attribution - NonCommercial

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HAL Id : hal-02939511 , version 1
DOI : 10.1016/j.jmmm.2019.165764
PII : S0304-8853(19)32416-3

Cite

Jean Ebothé. Magnetic properties dependence of mesoscopic scale thick films on thickness and surface roughness characteristics: case of nickel samples in Ni/Pt system. Journal of Magnetism and Magnetic Materials, 2020, 494, pp.165764. ⟨10.1016/j.jmmm.2019.165764⟩. ⟨hal-02939511⟩

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Magnetic properties dependence of mesoscopic scale thick films on thickness and surface roughness characteristics: case of nickel samples in Ni/Pt system

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